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Donghyun Lee	1 Article
Review of Electrical Characterization of Ceramic Thin Films for the Next Generation Semiconductor Devices Donghyun Lee, Kun Yang, Ju-Yong Park, Min Hyuk Park Ceramist. 2019;22(4):332-349. Published online December 31, 2019 DOI: https://doi.org/10.31613/ceramist.2019.22.4.03 Cited By 3 Full text PubReader ePub PDF

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