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Min Hyuk Park
1 Article
Review of Electrical Characterization of Ceramic Thin Films for the Next Generation Semiconductor Devices
Donghyun Lee, Kun Yang, Ju-Yong Park, Min Hyuk Park
Ceramist.
2019;22(4):332-349.
Published online December 31, 2019
DOI:
https://doi.org/10.31613/ceramist.2019.22.4.03
Cited By 3
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ABOUT
Aims and scope
About the journal
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Open access
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BROWSE ARTICLES
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