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Reviews
- Recent Technology for the Characterization of Nanomaterials by Electron Microscopy
- Jon-Do Yun
- Ceramist. 2007;10(5):41-48. Published online October 31, 2007
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- TEM Study on the Structural and Electrical Features of Grain Boundaries in Semiconducting Oxides
- Seon-Min Mun, Nam-Hui Jo, Myeong-Beom Park
- Ceramist. 2007;10(5):49-54. Published online October 31, 2007
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- 점토광물 소재의 투과전자현미경 분석기술
- Su-Jeong Lee
- Ceramist. 2007;10(5):55-62. Published online October 31, 2007
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- 국가적 대형장비인 HVEM의 세라믹분야 활용
- Yun-Jung Kim
- Ceramist. 2007;10(5):63-67. Published online October 31, 2007
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- Characterization of Thermoelectric Oxide Materials by HRTEM
- Won-Seon Seo
- Ceramist. 2007;10(5):68-73. Published online October 31, 2007
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- Analytical Techniques of X-ray Photoelectron Spectroscopy and the Application to Nano-scaled Thin Films
- Hyeong-Ho Park, Jun-Gyu Yang, Seon-Gyu Choe
- Ceramist. 2007;10(5):74-85. Published online October 31, 2007
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- Electron Probe MicroAnalysis: EPMA
- Seung-Muk Bae, Won-Seon Seo, Jin-Ha Hwang
- Ceramist. 2007;10(5):86-92. Published online October 31, 2007
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- Local Characterization by Atomic Force Microscopy (AFM)
- Gyeong-Hui Yu, Yu-Jeong Choe, Hyeon-Jeong Sin
- Ceramist. 2007;10(5):93-101. Published online October 31, 2007
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- Reliability trend on Ceramics
- Hyeong-Seok Choe
- Ceramist. 2007;10(5):102-107. Published online October 31, 2007
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Review
- Accelerated Life Testing and Failure Mode Analysis for Ceramic Electronic Parts
- Sun-Mok Choe
- Ceramist. 2007;10(5):108-116. Published online October 31, 2007
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