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Volume 10(5); Oct 2007
Reviews
Recent Technology for the Characterization of Nanomaterials by Electron Microscopy
Jon-Do Yun
Ceramist. 2007;10(5):41-48.   Published online October 31, 2007
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TEM Study on the Structural and Electrical Features of Grain Boundaries in Semiconducting Oxides
Seon-Min Mun, Nam-Hui Jo, Myeong-Beom Park
Ceramist. 2007;10(5):49-54.   Published online October 31, 2007
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점토광물 소재의 투과전자현미경 분석기술
Su-Jeong Lee
Ceramist. 2007;10(5):55-62.   Published online October 31, 2007
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국가적 대형장비인 HVEM의 세라믹분야 활용
Yun-Jung Kim
Ceramist. 2007;10(5):63-67.   Published online October 31, 2007
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Characterization of Thermoelectric Oxide Materials by HRTEM
Won-Seon Seo
Ceramist. 2007;10(5):68-73.   Published online October 31, 2007
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Analytical Techniques of X-ray Photoelectron Spectroscopy and the Application to Nano-scaled Thin Films
Hyeong-Ho Park, Jun-Gyu Yang, Seon-Gyu Choe
Ceramist. 2007;10(5):74-85.   Published online October 31, 2007
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Electron Probe MicroAnalysis: EPMA
Seung-Muk Bae, Won-Seon Seo, Jin-Ha Hwang
Ceramist. 2007;10(5):86-92.   Published online October 31, 2007
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Local Characterization by Atomic Force Microscopy (AFM)
Gyeong-Hui Yu, Yu-Jeong Choe, Hyeon-Jeong Sin
Ceramist. 2007;10(5):93-101.   Published online October 31, 2007
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Reliability trend on Ceramics
Hyeong-Seok Choe
Ceramist. 2007;10(5):102-107.   Published online October 31, 2007
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Review
Accelerated Life Testing and Failure Mode Analysis for Ceramic Electronic Parts
Sun-Mok Choe
Ceramist. 2007;10(5):108-116.   Published online October 31, 2007
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