| Make Field Ion Microscopy Great Again |
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Chang-Gi Lee, Won-Hyoung Lee, Se-Ho Kim |
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Department of Materials Science & Engineering, Korea University, Seoul, 02841, Republic of Korea |
| 전계 이온 현미경을 다시 위대하게 |
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이창기, 이원형, 김세호 |
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고려대학교 |
Correspondence:
Se-Ho Kim,
Email: sehonetkr@korea.ac.kr
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Received: 30 April 2025 • Accepted: 27 May 2025 |
| Abstract |
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“Ja atoms! Ja atoms!” shouted Erwin Müller upon first observing individual atoms using Field ion microscopy (FIM), a landmark in atomic-scale imaging. Since then, FIM has profoundly impacted materials science, offering unmatched atomic resolution through electric-field-induced ionization. This review systematically explores FIM’s theoretical foundations, historical evolution, and instrumental developments. Despite modern imaging methods, FIM uniquely reveals atomic surface dynamics, arrangements, and diffusion processes. Recent technological advancements integrating computational methods and enhanced detectors have overcome previous limitations, revitalizing interest in FIM and promising future breakthroughs in materials research. |
| Key Words:
Field evaporation, Field ion microscopy, Single atom observation |
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