| Local Bandgap Measurement using Monochromated STEM-VEELS |
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Hee Joon Jung |
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Korea Research Institute of Standards and Science, Daejeon, 34113, Republic of Korea |
| 고에너지분해능 주사투과전자현미경-최외각전자 에너지손실 분광법(STEM-VEELS)을 이용한 국소 밴드갭 측정 |
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정희준 |
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한국표준과학연구원 |
Correspondence:
Hee Joon Jung,
Email: hjjung@kriss.re.kr
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Received: 5 May 2025 • Accepted: 27 May 2025 |
| Abstract |
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This paper outlines the fundamentals and recent advancements in monochromated Scanning transmission electron microscopy–valence electron energy loss spectroscopy (STEM-VEELS) as a tool for bandgap characterization. Particular focus is given to experimental strategies such as Zero-loss peak (ZLP) subtraction, onset detection, and mitigation of spectral artefacts including Cerenkov radiation and guided optical modes. Case studies involving quantum dots, dielectrics, and low-dimensional semiconductors are discussed to highlight the capability of STEM-VEELS to resolve local bandgap variations. Future opportunities including AI-assisted analysis and time-resolved VEELS are also addressed. |
| Key Words:
Bandgap, Dielectric function, Monochromated STEM-VEELS, Valence electron energy loss spectroscopy (VEELS), ZLP subtraction |
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