| Recent Technological Innovations and Advances in X-Ray Microscopy |
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Sungjin Lee1,2 |
1Research Institute of Basic Sciences, Seoul National University, Seoul, Republic of Korea
2Institute of Paleontology, Mongolian Academy of Sciences, Ulaanbaatar, Mongolia |
| 엑스선 현미경 분야에서의 최근 기술 혁신 및 발전 동향 |
|
이성진1,2 |
1서울대학교 기초과학연구원
2몽골과학원 고생물학연구소 |
Correspondence:
Sungjin Lee,
Email: sungjinlee@snu.ac.kr
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Received: 7 May 2025 • Accepted: 27 May 2025 |
| Abstract |
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Since the discovery of X-ray, it has been used extensively to image internal structures or chemical compositions of materials varying from human body to battery cells. X-rays have short wavelengths and high energy compared with visible light and do not reflect or refract easily. The strong penetration capability of X-rays led to the invention of X-ray microscopy (XRM). XRM is thus a very powerful too that can be utilized to non-destructively image internal structures of materials, and with various image processing software, reconstruct 3-dimensional images. Although electron microscopy provides higher resolution images, XRM can scan thicker or denser materials without extensive preparation. Thanks to these advantages, XRM became widespread worldwide to be used in diverse fields of research and industry. With this growing interest, it is essential that researchers who are trying to use it understand basic properties and technical terms to exploit the full capacity of XRM. In this review, technological advances regarding resolution and contrast of XRM are investigated after the history and types of XRM are introduced. More recent innovations of laboratory and synchrotron-based systems are also explored, with existing models and facilities. Finally, the seemingly bright future of XRM, which is of course not precisely predictable, is briefly covered. |
| Key Words:
Micro-CT, Nano-CT, Synchrotron, X-Ray, X-Ray Microscopy |
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