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Volume 22(4); Dec 2019
Review
Review of Electrical Characterization of Ceramic Thin Films for the Next Generation Semiconductor Devices
Donghyun Lee, Kun Yang, Ju-Yong Park, Min Hyuk Park
Ceramist. 2019;22(4):332-349.   Published online December 31, 2019
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Investigation on 2D Transition Metal Chalcogenide Using Angular-Resolved Photoelectron Spectroscopy
Soohyung Park
Ceramist. 2019;22(4):350-356.   Published online December 31, 2019
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Secondary Ion Mass Spectrometry : Theory and Recent trends
Mirang Byeon, Da Young Kim, Tae Eun Hong
Ceramist. 2019;22(4):357-367.   Published online December 31, 2019
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Analysis of Ceramics Using Scanning Electron Microscopy
Sujeong Lee
Ceramist. 2019;22(4):368-380.   Published online December 31, 2019
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Atomic Force Microscopy Applications to the Next Generation Lithium-ion Batteries
Ji Hyun Lee, Sang Hyuk Gong, Hyeong Woo Kim, Hyung-Seok Kim
Ceramist. 2019;22(4):381-392.   Published online December 31, 2019
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Thermal Analysis of Ceramic Materials
Jaemin Cha, Liyu Liu, Bongki Ryu
Ceramist. 2019;22(4):393-401.   Published online December 31, 2019
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In situ Synchrotron X-ray Techniques for Structural Investigation of Electrode Materials for Li-ion Battery
Daseul Han, Kyung-Wan Nam
Ceramist. 2019;22(4):402-416.   Published online December 31, 2019
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Current Status of Liquid-cell Transmission Electron Microscopy
Jaeyoung Hong, Dong Won Chun
Ceramist. 2019;22(4):417-428.   Published online December 31, 2019
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Current Status of Quartz Glass for Semiconductor Process
Hyeong-Jun Kim
Ceramist. 2019;22(4):429-451.   Published online December 31, 2019
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Status of Quartz Glass Crucible
Sunghun Noh, NamHun Kang, Heuikeun Yun, Hyeong-Jun Kim
Ceramist. 2019;22(4):452-463.   Published online December 31, 2019
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